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Published in:

Volume 3 Issue 5
May-2016
eISSN: 2349-5162

Unique Identifier

JETIR1605004

Page Number

19-22

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Title

Self Repair Method To SRAM

ISSN

2349-5162

Cite This Article

"Self Repair Method To SRAM", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.3, Issue 5, page no.19-22, May-2016, Available :http://www.jetir.org/papers/JETIR1605004.pdf

Abstract

Built-In Self-Repair (BISR) with Redundancy is an effective yield-enhancement strategy for embedded memories. This paper proposes an efficient BISR strategy which consists of a Built-In Self-Test (BIST) module, a Built-In Address-Analysis (BIAA) module and a Multiplexer (MUX) module. The BISR is designed flexible that it can provide four operation modes to SRAM users. Each fault address can be saved only once is the feature of the proposed BISR strategy. In BIAA module, fault addresses and redundant ones form a one-to-one mapping to achieve a high repair speed. Besides, instead of adding spare words, rows, columns or blocks in the SRAMs, users can select normal words as redundancy. The selectable redundancy brings no penalty of area and complexity and is suitable for compiler design. A practical 4K × 32 SRAM IP with BISR circuitry is designed and implemented based on a 55nm CMOS process. Experimental results show that the BISR occupies 20% area and can work at up to 150MHz

Key Words

Built-In Self-Test (BIST) Built-In Self-Repair (BISR) Multiplexer (MUX

Cite This Article

"Self Repair Method To SRAM", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.3, Issue 5, page no. pp19-22, May-2016, Available at : http://www.jetir.org/papers/JETIR1605004.pdf

Publication Details

Published Paper ID: JETIR1605004
Registration ID: 160152
Published In: Volume 3 | Issue 5 | Year May-2016
DOI (Digital Object Identifier):
Page No: 19-22
ISSN Number: 2349-5162

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Cite This Article

"Self Repair Method To SRAM", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.3, Issue 5, page no. pp19-22, May-2016, Available at : http://www.jetir.org/papers/JETIR1605004.pdf




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