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Published in:

Volume 4 Issue 5
May-2017
eISSN: 2349-5162

Unique Identifier

JETIR1705028

Page Number

121-124

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Title

Advancements in Dimensional Metrology

Abstract

Dimensional Metrology has been evolving ever since the measurement standards were established. The need to minimize errors and improve upon accuracy and precision has prompted Metrologists across the globe to innovate measurement techniques. Any object produced should comply with its designated dimensions to meet the functional requirements. The innovative methods adopted for checking dimensional compliance of objects is discussed in this paper. This paper gives a brief overview of improvements in Coordinate Measuring Machines, use of Scanning Electron Microscope and Computed Tomography towards dimensional metrology, advancements and challenges in Micro and Nano dimensional metrology.

Key Words

Dimensional Metrology, Co-ordinate Measuring Machines, Scanning Electron Microscope, Computed Tomography

Cite This Article

"Advancements in Dimensional Metrology", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.4, Issue 5, page no.121-124, May-2017, Available :http://www.jetir.org/papers/JETIR1705028.pdf

Publication Details

Published Paper ID: JETIR1705028
Registration ID: 170320
Published In: Volume 4 | Issue 5 | Year May-2017
DOI (Digital Object Identifier): http://www.dx.doi.org/10.5281/zenodo.579693
ISSN Number: 2349-5162

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