ISSN: 2349-5162

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Published in:

Volume 4 Issue 12
December-2017
eISSN: 2349-5162

Unique Identifier

JETIR1712169

Page Number

1200-1210

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Title

BAND GAP AND RESISTIVITY MEASUREMENTS OF SEMICONDUCTOR MATERIALS FOR THIN FILMS

ISSN

2349-5162

Cite This Article

" BAND GAP AND RESISTIVITY MEASUREMENTS OF SEMICONDUCTOR MATERIALS FOR THIN FILMS", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.4, Issue 12, page no.1200-1210, December-2017, Available :http://www.jetir.org/papers/JETIR1712169.pdf

Abstract

ABSTRACT: This article briefly reviews and explores the basic properties of semiconducting materials, band gap, resistivity measurements and its applications in electronics and solar cells. The semiconductors are solid crystalline substances that tend to have greater electrical conductivity than insulators, but less than good conductors. The valence band of a semiconductor is full similarly to that of an insulator, but the band gap is much smaller (about 1 eV compared to about 5eV). In fact, the band gap in several semiconductors is so small that electrons are easily able to be thermally excited into the conduction band. This means that the electrical conductivity of many semiconductors is strongly reliant on temperature. Even though conductivity is not dependent only on the number of free electrons, materials with less than one free electron per million atoms will not easily be able to conduct electricity. To have practical uses for semiconductors the conductivity must be greatly increased and raising the temperature is not a very reliable way to achieve this goal. However, it is accomplished by doping (adding a very small amount of other atoms in with the semiconductors).

Key Words

Keywords: Semiconductor Material, Si and Ge, Conductivity, Resistivity, Band Gap, Doping, etc.

Cite This Article

" BAND GAP AND RESISTIVITY MEASUREMENTS OF SEMICONDUCTOR MATERIALS FOR THIN FILMS", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.4, Issue 12, page no. pp1200-1210, December-2017, Available at : http://www.jetir.org/papers/JETIR1712169.pdf

Publication Details

Published Paper ID: JETIR1712169
Registration ID: 186374
Published In: Volume 4 | Issue 12 | Year December-2017
DOI (Digital Object Identifier):
Page No: 1200-1210
ISSN Number: 2349-5162

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Cite This Article

" BAND GAP AND RESISTIVITY MEASUREMENTS OF SEMICONDUCTOR MATERIALS FOR THIN FILMS", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.4, Issue 12, page no. pp1200-1210, December-2017, Available at : http://www.jetir.org/papers/JETIR1712169.pdf




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