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Published in:

Volume 5 Issue 1
January-2018
eISSN: 2349-5162

Unique Identifier

JETIR1801153

Page Number

768-769

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Title

Reliability Analysis Of Automated System

ISSN

2349-5162

Cite This Article

"Reliability Analysis Of Automated System", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.5, Issue 1, page no.768-769, January-2018, Available :http://www.jetir.org/papers/JETIR1801153.pdf

Authors

Abstract

Unwavering quality is characterized as the likelihood of disappointment free framework operation in a predefined domain for a predetermined timeframe. It is imperative to survey the unwavering quality of the basic and non-basic frameworks and accessibility of the framework. Dependability models are an effective apparatus for foreseeing, controlling, and evaluating programming unwavering quality. A considerable measure of work on standby frameworks has been finished by different analysts in the field of unwavering quality displaying. In any case, the unwavering quality displaying on essential and standby databases is yet to be accounted for in the writing of dependability. Our point is to fill in such a hole.

Key Words

Reliability, System configuration, Standby redundant configuration, Laplace transforms

Cite This Article

"Reliability Analysis Of Automated System", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.5, Issue 1, page no. pp768-769, January-2018, Available at : http://www.jetir.org/papers/JETIR1801153.pdf

Publication Details

Published Paper ID: JETIR1801153
Registration ID: 180162
Published In: Volume 5 | Issue 1 | Year January-2018
DOI (Digital Object Identifier):
Page No: 768-769
ISSN Number: 2349-5162

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Cite This Article

"Reliability Analysis Of Automated System", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.5, Issue 1, page no. pp768-769, January-2018, Available at : http://www.jetir.org/papers/JETIR1801153.pdf




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