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Published in:

Volume 7 Issue 7
July-2020
eISSN: 2349-5162

Unique Identifier

JETIR2007289

Page Number

2246-2248

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Title

TACKLING OF SINGLE-EFFECT UPSET IN MICROPROCESSOR-BASED ARCHITECTURE

ISSN

2349-5162

Cite This Article

"TACKLING OF SINGLE-EFFECT UPSET IN MICROPROCESSOR-BASED ARCHITECTURE", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.7, Issue 7, page no.2246-2248, July-2020, Available :http://www.jetir.org/papers/JETIR2007289.pdf

Authors

Abstract

Since last five decades, research and development has taken place in fault tolerant microprocessor. There are increasing reliability issues for embedded systems in aerospace applications. Not only aerospace but telephone switching systems, industrial embedded systems also face this issue. In this paper, we will discuss how various processors tackled Single-Event Upset by various mitigation techniques like SEC/DED ECC, double modular and triple modular redundancy, parity, and even use of fault tolerant functional unit.

Key Words

Single-Event Effect, Single-Event Upset, Modular redundancy, Error correcting code, Arithmetic Login Unit, Reduced Instruction Set Computer

Cite This Article

"TACKLING OF SINGLE-EFFECT UPSET IN MICROPROCESSOR-BASED ARCHITECTURE", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.7, Issue 7, page no. pp2246-2248, July-2020, Available at : http://www.jetir.org/papers/JETIR2007289.pdf

Publication Details

Published Paper ID: JETIR2007289
Registration ID: 235407
Published In: Volume 7 | Issue 7 | Year July-2020
DOI (Digital Object Identifier):
Page No: 2246-2248
ISSN Number: 2349-5162

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Cite This Article

"TACKLING OF SINGLE-EFFECT UPSET IN MICROPROCESSOR-BASED ARCHITECTURE", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.7, Issue 7, page no. pp2246-2248, July-2020, Available at : http://www.jetir.org/papers/JETIR2007289.pdf




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