• Yogesh R. Tda
• Arun B. Jain
• Dhananjay N. Gujarathi

The nanocrystalline thin films of CuSe of thickness about ~300 nm were deposited on precleaned glass substrate by thermal vacuum evaporation technique under high vacuum conditions at different oblique angles (00, 150, 300, and 450). Phase formation and crystal structure of as deposited films have been analyzed by using X-ray diffractometer. Surface morphology and microstructure of these films are investigated by scanning electron microscope, UV-VIS-NIR spectroscopy was used to find out band gap of the films. The influence of oblique angle depositions on microstructural features and hence change in optical parameters has been presented and explained in this paper.

CuSe, Oblique Angle Deposition, XRD

"Influence of Oblique Angle Deposition on Nanostructured CuSe Thin Films and Their Structural, Morphological and Optical Properties", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.8, Issue 2, page no.1843-1849, February-2021, Available :http://www.jetir.org/papers/JETIR2102221.pdf

"Influence of Oblique Angle Deposition on Nanostructured CuSe Thin Films and Their Structural, Morphological and Optical Properties", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.8, Issue 2, page no. pp1843-1849, February-2021, Available at : http://www.jetir.org/papers/JETIR2102221.pdf