UGC Approved Journal no 63975(19)

ISSN: 2349-5162 | ESTD Year : 2014
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Published in:

Volume 6 Issue 1
January-2019
eISSN: 2349-5162

UGC and ISSN approved 7.95 impact factor UGC Approved Journal no 63975

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Published Paper ID:
JETIRDY06219


Registration ID:
233177

Page Number

1377-1381

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Title

X- RAY DIFFRACTION

Abstract

For determining the behaviour of material, the most important concept that we have to understand is its structure. Here, we have discussed how we calculate the dimensions of unit cell through which we have easily understand the internal structure of crystals. X-rd diffraction method is mostly used for analysing the crystals. Out of various method of X-rd, here we have explained only an easy and reliable powder method and factors which generally affect the peak of X-rd. Effect of stress, strain and temperature on peaks position and intensity.

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"X- RAY DIFFRACTION", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.6, Issue 1, page no.1377-1381, January 2019, Available :http://www.jetir.org/papers/JETIRDY06219.pdf

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2349-5162 | Impact Factor 7.95 Calculate by Google Scholar

An International Scholarly Open Access Journal, Peer-Reviewed, Refereed Journal Impact Factor 7.95 Calculate by Google Scholar and Semantic Scholar | AI-Powered Research Tool, Multidisciplinary, Monthly, Multilanguage Journal Indexing in All Major Database & Metadata, Citation Generator

Cite This Article

"X- RAY DIFFRACTION", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.6, Issue 1, page no. pp1377-1381, January 2019, Available at : http://www.jetir.org/papers/JETIRDY06219.pdf

Publication Details

Published Paper ID: JETIRDY06219
Registration ID: 233177
Published In: Volume 6 | Issue 1 | Year January-2019
DOI (Digital Object Identifier):
Page No: 1377-1381
Country: -, -, - .
Area: Engineering
ISSN Number: 2349-5162
Publisher: IJ Publication


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