• Mousumi Banerjee

Agriculture is the primary source of livelihood in India for about 58 per cent of India’s population. Protection of this source is main concerns. Preventing plants from different type of disease is a great challenge now. Automatic detection of infected plant can reduce the manual effort and the same time decrease processing time. Image Processing and Machine learning are the two main weapon, by which we can achieve this detection of infected plant. In this paper we mainly focused on Wheat Leaf disease classification by two machine learning approaches SVM and K-nearest neighbor.

Support vector machine (SVM), k-nearest neighbor, image processing

"SVM And k-NN Based Classification of Wheat Leaf Disease ", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.8, Issue 3, page no.917-920, March-2021, Available :http://www.jetir.org/papers/JETIR2103124.pdf

"SVM And k-NN Based Classification of Wheat Leaf Disease ", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.8, Issue 3, page no. pp917-920, March-2021, Available at : http://www.jetir.org/papers/JETIR2103124.pdf