UGC Approved Journal no 63975(19)

ISSN: 2349-5162 | ESTD Year : 2014
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Published in:

Volume 10 Issue 4
April-2023
eISSN: 2349-5162

UGC and ISSN approved 7.95 impact factor UGC Approved Journal no 63975

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Published Paper ID:
JETIR2304A26


Registration ID:
513728

Page Number

k182-k188

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Title

A PROGRAMMABLE AND PARAMETERISABLE RESEEDING LINEAR FEEDBACK SHIFT REGISTER

Abstract

In this project, we will design and implement a programmable and parameterizable Linear Feedback Shift Register (LFSR) for VLSI IC testing. The LFSR is used in circuit tests for test pattern generation (for exhaustive, pseudorandom, or pseudo-exhaustive testing) and as well as used for signature analysis. The complexity and size of SoCs are increasing at an alarming rate in modern times. There are errors that can occur during field manipulation of the device, attracting Logic Built-in-Self-Test (LBIST) over traditional ATE-based chip tests. A programmable and parameterizable LFSR can be used as test pattern generator for LBIST applications. The proposed design can generate any range of bits of vectors as per the choice of application. Also, the feedback polynomial can be parameterized to generate different length sequences. And LFSR can be configured into three different structural styles such as Fibonacci, Galois and Complete models. A Reseeding technique is introduced to leverage the LFSR to generate higher number of sequences without luring the storage requirements but testing out most of the random pattern resistant faults present in the circuit. The design is verified and analyzed in Xilinx Vivado2018.3 suite.

Key Words

: Test Pattern Generator, Programmable, Parameterizable, External LFSR, Internal LFSR, Complete LFSR, Reseeding LFSR, Logic BIST.

Cite This Article

"A PROGRAMMABLE AND PARAMETERISABLE RESEEDING LINEAR FEEDBACK SHIFT REGISTER ", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.10, Issue 4, page no.k182-k188, April-2023, Available :http://www.jetir.org/papers/JETIR2304A26.pdf

ISSN


2349-5162 | Impact Factor 7.95 Calculate by Google Scholar

An International Scholarly Open Access Journal, Peer-Reviewed, Refereed Journal Impact Factor 7.95 Calculate by Google Scholar and Semantic Scholar | AI-Powered Research Tool, Multidisciplinary, Monthly, Multilanguage Journal Indexing in All Major Database & Metadata, Citation Generator

Cite This Article

"A PROGRAMMABLE AND PARAMETERISABLE RESEEDING LINEAR FEEDBACK SHIFT REGISTER ", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.10, Issue 4, page no. ppk182-k188, April-2023, Available at : http://www.jetir.org/papers/JETIR2304A26.pdf

Publication Details

Published Paper ID: JETIR2304A26
Registration ID: 513728
Published In: Volume 10 | Issue 4 | Year April-2023
DOI (Digital Object Identifier):
Page No: k182-k188
Country: SPSR NELLORE, AP, India .
Area: Engineering
ISSN Number: 2349-5162
Publisher: IJ Publication


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