• Premjeet G. Jadhav
• Deelip S. Bhavsar

This research is based on an important semiconducting alloy i.e. zinc doped cadmium selenide ZnxCd1−xSe (x = 0.5 and x = 0.75). Thin films of zinc doped cdse (ZnxCd1−xSe) with different composition of x of a thickness of 1000 Å, 1500 Å, 2000 Å, 2500 Å were deposited by vacuum deposition technique under the high pressure of ~10-5 mbar onto a glass substrate. Core materials of zinc, cadmium and selenium of sigma eldritch of very high purity have been used for thin film deposition. In this work, we have studied zinc doped cdse (Zn0.75Cd0.25Se) thin films of a thickness of 1500 Å. The effect of Zinc content on different physics and chemical properties in Zn0.75Cd0.25Se thin films has been investigated. The XRD pattern shows that the two binary compounds have been completely transformed into a ternary compound with hexagonal and cubic structure and thin films are polycrystalline in nature. Scanning electron microscopy (SEM) gives details of the surface morphology of Zinc doped CdSe thin film. The energy dispersive x-ray (EDAX) analysis gives an elemental composition of materials of the thin film. Atomic Force Microscopy (AFM) provides a three-dimensional surface profile of the thin film. The Fourier Transform Infrared Spectroscopy (FTIR) analysis method uses infrared light to scan thin films and observe chemical properties.

Thin film, ZnCdSe, EDAX, XRD, Surface Morphology, SEM, AFM, FTIR.

"Study of Properties of Vacuum Deposited ZnCdSe Thin Films", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.7, Issue 2, page no.182-186, February-2020, Available :http://www.jetir.org/papers/JETIRDI06035.pdf

"Study of Properties of Vacuum Deposited ZnCdSe Thin Films", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.7, Issue 2, page no. pp182-186, February-2020, Available at : http://www.jetir.org/papers/JETIRDI06035.pdf