• Dr.Parveen Katyal

Breakdown Characteristics and electronic current data of tantalum oxide thin films in different electrolytes of various concentrations and compositions have been studied.The effects of electrolyte, concentration, composition, field strength, temperature of bath and resistivity of the electrolyte have been discussed.A linear relation between breakdown voltage and logarithm of electronic current has been observed.The relation between electronic current and field strength is found to be same irrespective of film thickness of tantalum oxide film.The major factor contributing to the decrease in breakdown voltage with increasing electrolyte concentration is the increasing primary electronic current.The effect of electrolyte concentration, composition and resistivity on breakdown voltage has been discussed in terms of Ikonopisov's electron injecting avalanche breakdown model of electrical breakdown.It has been found that with increase in temperature breakdown voltage decreases for same electrolyte concentration whereas it is independent of current density, field strength and topography of the specimen. It has been observed that during anodic oxidation the high field strength accelerates the electrons to an energy which is sufficient to free other electrons by impact ionization resulting in the multiplication of the avalanches and breaking the film at a critical voltage.

Thin Films, Oxide, Tantalum, Breakdown

"Breakdown Characteristics and Electronic Current Studies of Ta - Ta2O5 - Electrolyte Systems", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.2, Issue 9, page no.613-620, September 2015, Available :http://www.jetir.org/papers/JETIR1701936.pdf

"Breakdown Characteristics and Electronic Current Studies of Ta - Ta2O5 - Electrolyte Systems", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.2, Issue 9, page no. pp613-620, September 2015, Available at : http://www.jetir.org/papers/JETIR1701936.pdf