• ratnakar

The generation of significant power droop (PD) during at-speed test performed by Logic Built-In Self-Test (LBIST) is a serious concern for modern ICs. In fact, the PD originated during test may delay signal transitions of the circuit under test (CUT): an effect that may be erroneously recognized as delay faults, with consequent erroneous generation of test fails and increase in yield loss. In this paper, we propose a novel scalable approach to reduce the PD during at-speed test of sequential circuits with scan-based LBIST using the launch-on capture scheme. This is achieved by reducing the activity factor of the CUT, by proper modification of the test vectors generated by the LBIST of sequential ICs. Our scalable solution allows us to reduce PD to a value similar to that occurring during the CUT in field operation, without increasing the number of test vectors required to achieve target fault coverage (FC). We present a hardware implementation of our approach that requires limited area overhead. Finally, we show that, compared with recent alternative solutions providing a similar PD reduction, our approach enables a significant reduction of the number of test vectors (by more than 50%), thus the test time, to achieve a target FC. The proposed architecture of this paper analysis the logic size, area and power consumption using Xilinx 14.5.

Index Terms— Logic BIST (LBIST), microprocessor, power droop (PD), test.

"Scalable approach for electricity hunch reduction in the course of test-primarily based good judgment BIST", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.5, Issue 6, page no.151-161, June-2018, Available :http://www.jetir.org/papers/JETIR1806145.pdf

"Scalable approach for electricity hunch reduction in the course of test-primarily based good judgment BIST", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.5, Issue 6, page no. pp151-161, June-2018, Available at : http://www.jetir.org/papers/JETIR1806145.pdf