UGC Approved Journal no 63975(19)

ISSN: 2349-5162 | ESTD Year : 2014
Call for Paper
Volume 11 | Issue 4 | April 2024

JETIREXPLORE- Search Thousands of research papers



WhatsApp Contact
Click Here

Published in:

Volume 5 Issue 6
June-2018
eISSN: 2349-5162

UGC and ISSN approved 7.95 impact factor UGC Approved Journal no 63975

7.95 impact factor calculated by Google scholar

Unique Identifier

Published Paper ID:
JETIR1806563


Registration ID:
183951

Page Number

394-398

Share This Article


Jetir RMS

Title

Security Testing Aspects for IoT- Devices Memory

Abstract

Abstract— Internet-of-Things (IoT) has been seen all over in our day to day life routines. They are used in our homes, in colleges, in offices, deployed outside to control and report the changes in environment, prevent fires, and much more valuable functionality. However, all those benefits can come of enormous risks of privacy loss and security issues. To secure the IoT devices, many research works have been conducted to countermeasure those problems and find a better way to eliminate those risks, or at least minimize their effects on the user's privacy and security requirements. This paper analyses Security Concerns of IoT with respect to Device Memory. We will be discussing the most relevant limitations of IoT devices and their solutions. The second one will present the classification of IoT attacks. The next segment will focus on the mechanisms and architectures for authentication and access control, IoT, Security Architectures, security threats for IoT- Device Memory.

Key Words

Encryption, Authentication, Internet, Privacy, Software

Cite This Article

"Security Testing Aspects for IoT- Devices Memory ", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.5, Issue 6, page no.394-398, June-2018, Available :http://www.jetir.org/papers/JETIR1806563.pdf

ISSN


2349-5162 | Impact Factor 7.95 Calculate by Google Scholar

An International Scholarly Open Access Journal, Peer-Reviewed, Refereed Journal Impact Factor 7.95 Calculate by Google Scholar and Semantic Scholar | AI-Powered Research Tool, Multidisciplinary, Monthly, Multilanguage Journal Indexing in All Major Database & Metadata, Citation Generator

Cite This Article

"Security Testing Aspects for IoT- Devices Memory ", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.5, Issue 6, page no. pp394-398, June-2018, Available at : http://www.jetir.org/papers/JETIR1806563.pdf

Publication Details

Published Paper ID: JETIR1806563
Registration ID: 183951
Published In: Volume 5 | Issue 6 | Year June-2018
DOI (Digital Object Identifier):
Page No: 394-398
Country: Thane, Maharashtra, India .
Area: Science & Technology
ISSN Number: 2349-5162
Publisher: IJ Publication


Preview This Article


Downlaod

Click here for Article Preview

Download PDF

Downloads

0002924

Print This Page

Current Call For Paper

Jetir RMS