• SHIVANI
• Dr. Raghav mehra

Mutation testing is one of the most powerful approaches for evaluating to evaluate the fault detection capability of the test data by inserting errors into the original program to generate mutations, and after then check whether tests are good enough to detect them. Mutation Testing is basically classified in two categories. One is first order Mutation Testing and second one is the Higher order Mutation Testing. This paper explain a new form for Mutation Testing, called as a Higher Order Mutation Testing (HOM Testing), it was first proposed by Harman and Jia in year 2009 and gave the one of the most promising solutions. Traditional Mutation Testing works on only first order mutants, created by the injection of a single fault. First order mutants denote trivial faults that are easily killed. Higher order mutants are created by the insertion of two or more faults. In this paper we want to introduces the detail of a subsuming HOM; HOM mutants are harder to kill than first order mutants from which it is constructed. By definition, subsuming HOMs denote subtle fault combinations. Keywords: Mutation Testing, Test Data Generation, Subsuming HOMs Systematic Mapping.

Mutation Testing, Test Data Generation, Subsuming HOMs Systematic Mapping

"Development of Higher Order Mutation Testing and Methods for finding the good HOM", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.5, Issue 11, page no.11-22, November-2018, Available :http://www.jetir.org/papers/JETIR1811803.pdf

"Development of Higher Order Mutation Testing and Methods for finding the good HOM", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.5, Issue 11, page no. pp11-22, November-2018, Available at : http://www.jetir.org/papers/JETIR1811803.pdf