• Sallagarige Niranjan
• Dr. B. Venkateswara Rao

This paper critically evaluates the utility of seismic data to assist in the interpretation of subsurface layers. Seven seismic refraction profiles were conducted inside the JNTUH campus to determine the subsurface layer velocities and thicknesses. A 12-channel Seismograph with geophone spacing of 5 m is employed. SeisImager-2D and Seismodule software tools were also used in data interpretation and analysis part of the work. The obtained data of arrival times are processed and plotted on the graphs with Excel to identify the velocity of layers and the depths of different seismic profiles. Characterization of the material is made on the basis of seismic velocity and other geological information. Based on the study, the results of the survey gave a three-layer model. The seismic wave velocity of first layer varies from 744-1250 m/s with depth varied from 5.54 to 8.116 m while layer two has velocity in the range of 1836-3225 m/s with depth varied from 9.14 to 12.88 m which has thickness about 3.60 to 6.115 m and third layer velocity lies between 4545-5882 m/s. Subsurface layers are interpreted as (1) Soil layer followed by (2) Weathered layer with moisture underlain by (3) Massive granite rock. We developed a clear understanding of the subsurface structure in the study area and mapped its depth.

Seismic refraction, subsurface layer, seismograph, geophone, geological.

"Determination of Thickness of Subsurface Layers by Using Shallow Seismic Unit", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.6, Issue 1, page no.276-284, January-2019, Available :http://www.jetir.org/papers/JETIR1901740.pdf

"Determination of Thickness of Subsurface Layers by Using Shallow Seismic Unit", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.6, Issue 1, page no. pp276-284, January-2019, Available at : http://www.jetir.org/papers/JETIR1901740.pdf