• P.Ananda
• S.Victor vedanayakam
• K.Thyagarajan
• V. Manjunath
• G. Manjunatha

The noble metal Titanium has many attractive properties. The thin film devices of Titanium are specially used in aerospace technology and also in microelectronics. In this paper, we discuss 1/f noise and nonlinear effects in titanium thin films for different current densities of varying thickness of the film at room temperature. Particularly the dependence of the 1/f noise on different thickness of the Titanium film and the effect of current densities has been investigated. The plots are dawn for 1/f noise of Titanium coated thin films deposited on glass substrate using electron beam evaporation, ranging from 180 nm to 270 nm and the slopes are estimated. It is found that at thickness of 250 nm the noise pattern of the thin film shows a decrement. With regard to Structural properties of AFM, the film surface roughness decreases with increases in thickness.

Titanium Thin Film, 1/f Noise, Structural properties of AFM, E-beam evaporation system, different thicknesses.

"Influence of the thickness on 1/f noise and morphological properties of Titanium based thin films deposited by e-beam evaporation method", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.6, Issue 2, page no.745-756, February-2019, Available :http://www.jetir.org/papers/JETIR1902497.pdf

"Influence of the thickness on 1/f noise and morphological properties of Titanium based thin films deposited by e-beam evaporation method", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.6, Issue 2, page no. pp745-756, February-2019, Available at : http://www.jetir.org/papers/JETIR1902497.pdf