• S.K Behera
• P.S Sahoo
• B.B Mohanty
• L.K. Mishra
• R.N.P Choudhary

Layered perovskite samples having general formula CaBi4Ti4-xZrxO15 (x=0, 4) are synthesised following mixed oxide process at an optimum temperature 850oC and 800oC for x=0 and x=4 respectively. The XRD analysis confirms the formation of compounds and their crystal structure. Micro structural information of the samples is studied by the SEM micrographs. The relative dielectric constant (εr) of the samples are analysed over a broad span of temperature ranging from 30oC to 500°C and frequency (1 kHz to 1 MHz). No phase transition is found on the parent compound sample calcium Bismuth Titanate (i.e CaBi4Ti4O15) in the experimental temperature range. However, on substitution of Zr on Ti site of the parent material, transition temperature is found at 389 oC. The sample exhibits diffused phase transition. The conductivity study reveals the negative temperature coefficient of resistance (NTCR) phenomena in both the materials.

mixed oxide process, diffused dielectric phenomena, electrical conductivity, XRD

"Synthesis and Dielectric characterization of Zr modified Calcium BismuthTitanate.", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.6, Issue 3, page no.780-786, March-2019, Available :http://www.jetir.org/papers/JETIR1903K19.pdf

"Synthesis and Dielectric characterization of Zr modified Calcium BismuthTitanate.", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.6, Issue 3, page no. pp780-786, March-2019, Available at : http://www.jetir.org/papers/JETIR1903K19.pdf