• J.GOBINATH
• P.Gowthaman
• M.Venkatachalam
• M.Saroja
• G.Parthasarathy

Abstract In the present work, conventional chemical sol-gel dip coating method was employed for the preparation of CdS nanoparticles. XRD studies reveal that CdS crystallizes in single phase hexagonal structure. The particle size of CdS nanoparticles is obtained as 13nm.In recent decades innovative nanomaterials have been broadly studied, aiming at both investigating the structure-property relationship and discovering new properties, in order to achieve pertinent improvements in current state-of-the art materials. Recently, controlled growth and assembly of nanostructures into hierarchical and complex architectures have played a key role in engineering novel functionalized materials. Since the structural characterization of such CdS nanomaterials is a fundamental step, here we discuss X-ray scattering/diffraction techniques to analyze CdS nanomaterials under different annealing temperature.

Keywords: CdS nanoparticles, Sol-Gel Dip Coating, XRD, Thermal annealing

"Investigation on X-ray diffraction of CdS Thin Films Prepared by Sol-Gel Dip Coating Method", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.6, Issue 4, page no.645-648, April-2019, Available :http://www.jetir.org/papers/JETIR1904090.pdf

"Investigation on X-ray diffraction of CdS Thin Films Prepared by Sol-Gel Dip Coating Method", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.6, Issue 4, page no. pp645-648, April-2019, Available at : http://www.jetir.org/papers/JETIR1904090.pdf