UGC Approved Journal no 63975(19)
New UGC Peer-Reviewed Rules

ISSN: 2349-5162 | ESTD Year : 2014
Volume 13 | Issue 3 | March 2026

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Published in:

Volume 6 Issue 5
May-2019
eISSN: 2349-5162

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Published Paper ID:
JETIR1905L81


Registration ID:
212915

Page Number

529-534

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Title

Comparative Study of Characterization of CdSe, ZnSe and Cd0.5Zn0.5Se Thin Films Prepared by Vacuum Deposition Technique

Abstract

The Cadmium Selenide (CdSe) and The Zinc Selenide (ZnSe) are binary compounds of II-VI group were zinc doped cadmium selenide (Cd0.5Zn0.5Se) is a ternary compound of II-VI group. All of these are very important semiconducting alloys for electronics and optoelectrical applications. The Thin films of CdSe, ZnSe, and Cd0.5Zn0.5Se were deposited on a cleaned glass substrate by vacuum deposition technique under the pressure of ~10-5 mbar. In this research paper, we have studied thin films of a thickness of 1000 Å of CdSe, ZnSe, and Cd0.5Zn0.5Se. The ingot was formed by melt quench method of granules of core cadmium, granules of core zinc and powder of core selenium of Sigma Eldritch having purity 99.99. A powder of CdSe, ZnSe, and Cd0.5Zn0.5Se obtain by grinding ingot in a porcelain pot. The powder obtained from ingot is then heated in molybdenum boat up to 700 0C to 1100 0C and current 110 A. In this present work we have studied the effect of Zinc content on morphological, compositional and structural properties in Cd0.5Zn0.5Se thin films and compared the characteristics like XRD and SEM with that of CdSe and ZnSe thin films. The lattice parameter a, The particle size D and the hkl indices were also studied. The XRD pattern gives structural information of CdSe, ZnSe, and the Cd0.5Zn0.5Se thin films. Scanning electron microscopy (SEM) gives us the surface morphological images of CdSe, ZnSe, and Cd0.5Zn0.5Se thin films

Key Words

Thin film, CdSe, ZnSe, Cd0.5Zn0.5Se, Crystal Structure, XRD, Surface Morphology, SEM, vacuum

Cite This Article

"Comparative Study of Characterization of CdSe, ZnSe and Cd0.5Zn0.5Se Thin Films Prepared by Vacuum Deposition Technique", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.6, Issue 5, page no.529-534, May-2019, Available :http://www.jetir.org/papers/JETIR1905L81.pdf

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2349-5162 | Impact Factor 7.95 Calculate by Google Scholar

An International Scholarly Open Access Journal, Peer-Reviewed, Refereed Journal Impact Factor 7.95 Calculate by Google Scholar and Semantic Scholar | AI-Powered Research Tool, Multidisciplinary, Monthly, Multilanguage Journal Indexing in All Major Database & Metadata, Citation Generator

Cite This Article

"Comparative Study of Characterization of CdSe, ZnSe and Cd0.5Zn0.5Se Thin Films Prepared by Vacuum Deposition Technique", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.6, Issue 5, page no. pp529-534, May-2019, Available at : http://www.jetir.org/papers/JETIR1905L81.pdf

Publication Details

Published Paper ID: JETIR1905L81
Registration ID: 212915
Published In: Volume 6 | Issue 5 | Year May-2019
DOI (Digital Object Identifier):
Page No: 529-534
Country: Bhusawal, MAHARASHTRA, India .
Area: Physics
ISSN Number: 2349-5162
Publisher: IJ Publication


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