• K SREENIVASULU NAIK
• M.MADHU BABU

Every year the complexity of communication systems and signal processing circuits will increase. This can be done by the CMOS technology scaling that allows the integration of too many transistors on a single device. This improved complexity will leads to failure of circuits. Identically, the transistors will run with low supply and are leads to errors due to noise and variations in the manufacturing. Hence, soft errors also increase as technology scaling increases. A soft error alters the actual value of the system which will disturb the electronic circuits operation. In order to overcome such situation, the best choice is to utilize Algorithmic-Based Fault Tolerance (ABFT) techniques for some applications. ABFT use algorithmic properties to locate and correct errors. ABFT technique is suitable for communication and signal processing applications. Fast Fourier Transforms (FFTs) is one of the examples which are major building blocks in many systems. To locate and correct errors in FFTs, many protection schemes have been proposed. Those protection schemes are Error Correction Codes and Parseval or Sum of Square (SOS) checks. These techniques are first applied to protect FFTs. Then by combining both error correction codes and Parseval or SOS checks a new improved protection scheme have been proposed and evaluated. The proposed scheme results in reduced computational time and implementation cost of protection.

Error correction codes (ECCs), SOS checks, FFTs, Vedic multiplier, soft errors.

"ENHANCED FAULT TOLERANT PARALLEL FFTS USING ERROR CORRECTION CODES AND PARSEVAL CHECKS USING ANCIENT VEDIC SUTRA ", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.6, Issue 6, page no.387-392, June 2019, Available :http://www.jetir.org/papers/JETIR1907P56.pdf

"ENHANCED FAULT TOLERANT PARALLEL FFTS USING ERROR CORRECTION CODES AND PARSEVAL CHECKS USING ANCIENT VEDIC SUTRA ", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.6, Issue 6, page no. pp387-392, June 2019, Available at : http://www.jetir.org/papers/JETIR1907P56.pdf