• Veena Yadav
• Dr. Uday Panwar

Built-in Self Test, or BIST, is the technique of designing additional hardware and software features into integrated circuits to allow them to perform self-testing. A linear-feedback shift register (LFSR) is a shift register whose input bit is a linear function of its previous state. Field programmable gate array (FPGA) has become widely accepted design approach for low- and medium-range application because of functional flexibility and low development cost. The role of testing is to detect whether something went wrong and the role of diagnosis is to determine exactly what went wrong. This work proposes an implementation of built in self test using verilog coding on xilnx 14.7 software. In this work, also implement Linear Feedback Shift Register and SRAM controller to support BIST for performance improvement.

BIST, LFSR, SRAM, Controller, Latency, Area, High Speed, Low Power, Frequency

"A Verilog Implementation of Built in Self Test with Linear Feedback Shift Register for Performance Improvement ", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.6, Issue 6, page no.5-10, June 2019, Available :http://www.jetir.org/papers/JETIR1908150.pdf

"A Verilog Implementation of Built in Self Test with Linear Feedback Shift Register for Performance Improvement ", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.6, Issue 6, page no. pp5-10, June 2019, Available at : http://www.jetir.org/papers/JETIR1908150.pdf