UGC Approved Journal no 63975(19)

ISSN: 2349-5162 | ESTD Year : 2014
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Published in:

Volume 7 Issue 5
May-2020
eISSN: 2349-5162

UGC and ISSN approved 7.95 impact factor UGC Approved Journal no 63975

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Published Paper ID:
JETIR2005088


Registration ID:
231571

Page Number

598-600

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Title

Methods for Accurate Resistance Measurement

Abstract

Many devices have components that have very low ohmic properties. The resistances of these components should be measured to ensure their value doesn’t change. An overview is presented on precision resistance measurement for values less than 100Ω. Few techniques like Wheatstone bridge, current-voltage method, current comparators are discussed here

Key Words

Adaptive Wheatstone bridge, Direct current comparator, Resistance measurement

Cite This Article

"Methods for Accurate Resistance Measurement", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.7, Issue 5, page no.598-600, May-2020, Available :http://www.jetir.org/papers/JETIR2005088.pdf

ISSN


2349-5162 | Impact Factor 7.95 Calculate by Google Scholar

An International Scholarly Open Access Journal, Peer-Reviewed, Refereed Journal Impact Factor 7.95 Calculate by Google Scholar and Semantic Scholar | AI-Powered Research Tool, Multidisciplinary, Monthly, Multilanguage Journal Indexing in All Major Database & Metadata, Citation Generator

Cite This Article

"Methods for Accurate Resistance Measurement", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.7, Issue 5, page no. pp598-600, May-2020, Available at : http://www.jetir.org/papers/JETIR2005088.pdf

Publication Details

Published Paper ID: JETIR2005088
Registration ID: 231571
Published In: Volume 7 | Issue 5 | Year May-2020
DOI (Digital Object Identifier):
Page No: 598-600
Country: -, -, -- .
Area: Engineering
ISSN Number: 2349-5162
Publisher: IJ Publication
Published Paper URL :: https://www.jetir.org/view?paper=JETIR2005088
Published Paper PDF: https://www.jetir.org/papers/JETIR2005088

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