• Rishi Shukla
• Prof. Anshuj Jain

Built-in Self Test, or BIST, is the technique of designing additional hardware and software features into integrated circuits to allow them to perform self-testing. A linear-feedback shift register (LFSR) is a shift register whose input bit is a linear function of its previous state. Field programmable gate array (FPGA) has become widely accepted design approach for low- and medium-range application because of functional flexibility and low development cost. The role of testing is to detect whether something went wrong and the role of diagnosis is to determine exactly what went wrong. This paper proposes an implementation of built in self test using verilog coding on xilnx 14.7 software. In this work, also implement Linear Feedback Shift Register and SRAM controller to support BIST for performance improvement.

BIST, LFSR, SRAM, Controller, Latency, Area, High Speed, Low Power

"Implementation and Performance Improvement of Built in Self Test with Linear Feedback Shift Register ", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.7, Issue 12, page no.165-170, December-2020, Available :http://www.jetir.org/papers/JETIR2012222.pdf

"Implementation and Performance Improvement of Built in Self Test with Linear Feedback Shift Register ", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.7, Issue 12, page no. pp165-170, December-2020, Available at : http://www.jetir.org/papers/JETIR2012222.pdf