• R.S.Meshram
• R.M.Thombnre

Copper Sulphide thin films were prepared at 3000C temperature by using the thio urea and copper (II) chloride aqueous solutions .The structural, surface morphological and EDS properties of the as deposited thin films were investigated via X-ray diffraction, Scanning electron microscopy, and EDS. Thickness of the thin films determined by using gravimetric weight difference method. Thickness of the as deposited thin films were found t=0.5384 µm, 0.5174 µm and 0.4482µm. X-ray diffraction pattern reveals that all the prepared thin films are polycrystalline in nature and crystallized in hexagonal structure with atomic planes preferential orientation along (102), (103) (112)and (110) direction . The crystalline size increases from 35 nm to 57 nm. Uniform deposition having nanocrystalline granular morphology distributed over the entire glass substrate was observed through FESEM studies. EDS spectra showed the chemical purify of the films. X-ray diffraction (XRD) patterns show that crystallinities of the films are dependent on the copper concentration in the solutions.

"Structural and Morphological Properties of CuS Thin Films Prepared By Spray Pyrolysis Technique", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.8, Issue 12, page no.a47-a50, December-2021, Available :http://www.jetir.org/papers/JETIR2112009.pdf

"Structural and Morphological Properties of CuS Thin Films Prepared By Spray Pyrolysis Technique", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.8, Issue 12, page no. ppa47-a50, December-2021, Available at : http://www.jetir.org/papers/JETIR2112009.pdf