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Published in:

Volume 8 Issue 12
December-2021
eISSN: 2349-5162

UGC and ISSN approved 7.95 impact factor UGC Approved Journal no 63975

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Published Paper ID:
JETIR2112541


Registration ID:
318504

Page Number

f318-f324

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Title

Conduction process and estimation of defect density of states in Te15(Se100-xBix)85 (x = 0, 1, 2, 3, 4 at.%) amorphous semiconductors using AC conductivity measurements

Abstract

The ac conductivity of Te15(Se100-xBix)85 (x=0, 1, 2, 3, 4 at.%) amorphous glassy alloys in bulk has been studied using Wayne Kerr 6500B, impedance analyser at different temperatures and frequencies. The experimental results indicate that ac conductivity of samples is frequency dependent. The ac conductivity is found to increase with frequency of applied voltage obeying the law. Due to defects in the amorphous materials, a good density of defect states has been observed in the middle of the band gap. The defects in these materials probably arise as a result of under-coordination or over-coordination of atoms in the materials and are responsible for these states. These states can be analysed in terms of dangling bonds and valance alternation pairs. In the present paper the defect density of states in the band gap between the valence and conduction bands has been estimated. The correlated barrier hopping model (CBH) has been used to explain the frequency dependence of ac conductivity and estimation of density of defect states.

Key Words

AC conductivity, amorphous materials, defect states, dangling bonds

Cite This Article

"Conduction process and estimation of defect density of states in Te15(Se100-xBix)85 (x = 0, 1, 2, 3, 4 at.%) amorphous semiconductors using AC conductivity measurements", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.8, Issue 12, page no.f318-f324, December-2021, Available :http://www.jetir.org/papers/JETIR2112541.pdf

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2349-5162 | Impact Factor 7.95 Calculate by Google Scholar

An International Scholarly Open Access Journal, Peer-Reviewed, Refereed Journal Impact Factor 7.95 Calculate by Google Scholar and Semantic Scholar | AI-Powered Research Tool, Multidisciplinary, Monthly, Multilanguage Journal Indexing in All Major Database & Metadata, Citation Generator

Cite This Article

"Conduction process and estimation of defect density of states in Te15(Se100-xBix)85 (x = 0, 1, 2, 3, 4 at.%) amorphous semiconductors using AC conductivity measurements", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.8, Issue 12, page no. ppf318-f324, December-2021, Available at : http://www.jetir.org/papers/JETIR2112541.pdf

Publication Details

Published Paper ID: JETIR2112541
Registration ID: 318504
Published In: Volume 8 | Issue 12 | Year December-2021
DOI (Digital Object Identifier):
Page No: f318-f324
Country: SUNDERNAGAR, HIMACHAL PRADESH, India .
Area: Physics
ISSN Number: 2349-5162
Publisher: IJ Publication


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