• chandrashekhar l gamit
• vikas bhavsar
• dr.madhavi dave

The Nanocrystalline lead sulphide (PbS) thin films were deposited on a clean glass substrate using successive ionic layer absorption and reaction (SILAR) method at the different number of cycles having pH value 11 treated at a room temperature 303K and annealed at 150OC and then cool down at room temperature by using lead nitrate, thiourea, and sodium hydroxide as chemical precursors as Pb+2 and S-2 ions sources respectively. The structural studies, Elemental analysis and surface morphological were performed by X-ray diffraction (XRD), Energy dispersive spectroscopy (EDAX), and Scanning electron Microscope (SEM). The XRD showed films of cubic (galena), crystalline with the preferential (220) orientation. The PBS thin films were obtained under optimal deposition conditions were found to be polycrystalline with Rock salt (NaCl) face centered cubic structure. The lattice parameter, grain size, the strain was calculated. The values of the average crystalline sizes were found to be in the ranges of (33-39) nm. The EDAX investigation of the given example confirms the presence of Lead and Sulfur with no other component present, suggesting its virtue was additionally done, implying its purity was also carried out. The Grain size determined from scanning electron microscopy (SEM) increased from 450nm to 777nm.

Lead sulphide nanocrystalline; Thin film; SILAR; XRD; EDAX and SEM.

"STUDY STRUCTURAL PROPERTIES, ELEMENTAL ANALYSIS AND SURFACE MORPHOLOGICAL OF SILAR-GROWN HIGHLY ORIENTED LEAD SULPHIDE (PbS) THIN FILMS", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.9, Issue 3, page no.a598-a603, March-2022, Available :http://www.jetir.org/papers/JETIR2203071.pdf

"STUDY STRUCTURAL PROPERTIES, ELEMENTAL ANALYSIS AND SURFACE MORPHOLOGICAL OF SILAR-GROWN HIGHLY ORIENTED LEAD SULPHIDE (PbS) THIN FILMS", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.9, Issue 3, page no. ppa598-a603, March-2022, Available at : http://www.jetir.org/papers/JETIR2203071.pdf