UGC Approved Journal no 63975(19)
New UGC Peer-Reviewed Rules

ISSN: 2349-5162 | ESTD Year : 2014
Volume 12 | Issue 9 | September 2025

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Published in:

Volume 10 Issue 5
May-2023
eISSN: 2349-5162

UGC and ISSN approved 7.95 impact factor UGC Approved Journal no 63975

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Published Paper ID:
JETIR2305588


Registration ID:
515863

Page Number

f604-f608

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Title

COMPREHENSIVE REVIEW OF USING BIG DATA ANALYTICS FOR SMART SEMICONDUCTOR MANUFACTURING

Abstract

The emergence of Industry 4.0 is to optimize production processes, increase efficiency and reduce costs[1]. The integration of big data analytics into smart design enables the collection and analysis of large volumes of data from multiple sources, including sensors, machines, and human input. This article provides a qualitative review of the existing literature on big data analytics in smart manufacturing, including challenges, implications, and future directions. We examine different methods and techniques used in big data analysis, such as machine learning, deep learning and natural language processing, and their applications at different levels of the manufacturing process, from product to after-sales service. We also discuss issues related to the use of big data analytics in smart design, including data quality, data security, and data management. Finally, we present future research directions and recommendations for the use of big data analytics in intelligent design, such as the development of hybrid algorithms and the integration of time analysis. This study will be beneficial for researchers, practitioners and policy makers who want to use big data analytics for smart manufacturing

Key Words

Smart Manufacturing, Semiconductor, Big Data, Data Analysis, Big Data Architecture

Cite This Article

"COMPREHENSIVE REVIEW OF USING BIG DATA ANALYTICS FOR SMART SEMICONDUCTOR MANUFACTURING", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.10, Issue 5, page no.f604-f608, May-2023, Available :http://www.jetir.org/papers/JETIR2305588.pdf

ISSN


2349-5162 | Impact Factor 7.95 Calculate by Google Scholar

An International Scholarly Open Access Journal, Peer-Reviewed, Refereed Journal Impact Factor 7.95 Calculate by Google Scholar and Semantic Scholar | AI-Powered Research Tool, Multidisciplinary, Monthly, Multilanguage Journal Indexing in All Major Database & Metadata, Citation Generator

Cite This Article

"COMPREHENSIVE REVIEW OF USING BIG DATA ANALYTICS FOR SMART SEMICONDUCTOR MANUFACTURING", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.10, Issue 5, page no. ppf604-f608, May-2023, Available at : http://www.jetir.org/papers/JETIR2305588.pdf

Publication Details

Published Paper ID: JETIR2305588
Registration ID: 515863
Published In: Volume 10 | Issue 5 | Year May-2023
DOI (Digital Object Identifier):
Page No: f604-f608
Country: Mumbai, Maharashtra, India .
Area: Science & Technology
ISSN Number: 2349-5162
Publisher: IJ Publication


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