• Ishika Bhardwaj
• Dr. Shruti Dutt

The aim of the current study was to examine the relationship between attachment styles, breakup distress and post traumatic growth following romantic breakup of adults. 100 participants within the age range of 18-27 and hailing from different socio-economic backgrounds gave their consent to be a part of this study. Participants completed self reported questionnaires for Attachment styles (Experiences in Close Relationship Scale- Short Form (ECR-S)), Breakup distress (Breakup Distress Scale) and Post breakup growth ( Post Traumatic Growth Inventory). Data was analysed using Pearson’s Correlation using SPSS software. Results indicated a significant relationship between Attachment styles and Breakup distress, while no significant relationship was found between breakup distress and post breakup growth and attachment styles and post breakup growth. However, there was a weak correlation between the two respectively. In Conclusion, people with insecure attachment styles experience greater breakup distress even after a significant amount of time has passed since the breakup, following which they do not experience positive growth. There were some limitations to the study that can be addressed by future researchers such as the self-selection of the participant samples in these tests may have reduced the universality of our outcomes. The few prior studies on this subject may also be a limitation to research.

Attachment Styles, Breakup Distress, Post Breakup Growth, Insecure Attachment

"Attachment Styles, Breakup Distress and Post-Breakup Growth following Relationship Dissolution.", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.10, Issue 5, page no.l295-l304, May-2023, Available :http://www.jetir.org/papers/JETIR2305B45.pdf

"Attachment Styles, Breakup Distress and Post-Breakup Growth following Relationship Dissolution.", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.10, Issue 5, page no. ppl295-l304, May-2023, Available at : http://www.jetir.org/papers/JETIR2305B45.pdf