• Ashna Joyson
• Aswathy .S
• Reni. M
• Josna Johnson
• Vipin. R

The Rietveld refinement is a popular analytical technique for the quantitative phase analysis of various natural and synthetic materials. It can be used for both fully crystalline multiphase systems as well as for materials containing even an amorphous fraction. This method involves the analysis of XRPD data and utilizes the Rietveld refinement technique to determine the relative proportions of each phase present in the sample. Overall, the Rietveld method offers a reliable and accurate means of characterizing materials and is essential for various scientific and industrial applications. A modified version of the Rietveld computer program has been used to perform quantitative phase analysis of multicomponent mixtures using X-ray powder diffraction data. The improved program was successful in determining composition of mixtures with high accuracy and precision. Quantitative information was obtained through refined individual scale factors and unit cell volumes using Rietveld refinement program. The analytical report of quantitative phase analysis using Rietveld refinement method specify the details of the instrument used for data collection as well as software and databases employed for the Rietveld refinement. To correct the preferred orientation, we processed the XRPD patterns using commonly available program Rietveld refinement. It allows for accurate determination of crystal structure, lattice parameter and atomic positions.

Rietveld refinement, XRPD, Quantitative phase analysis, Batch dose uniformity

"RIETVELD REFINEMENT: GOLD STANDARD OF QUANTITATIVE ANALYSIS", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.10, Issue 6, page no.k450-k455, June-2023, Available :http://www.jetir.org/papers/JETIR2306A55.pdf

"RIETVELD REFINEMENT: GOLD STANDARD OF QUANTITATIVE ANALYSIS", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.10, Issue 6, page no. ppk450-k455, June-2023, Available at : http://www.jetir.org/papers/JETIR2306A55.pdf