• G. J. Naga Raju

Particle Induced X-ray Emission (PIXE) is a well-recognized nondestructive method for analyzing samples for their elemental content. Due to its high sensitivity, multi-elemental analysis capability, non-destructive nature, ability to analyze tiny samples and suitability for a wide range of samples, this technique has served as an important tool for elemental analysis. The X-ray emission spectrum obtained in PIXE serves as a blue print for identifying and quantifying elements. The energies of the characteristic peaks help in identifying the elements and their intensities help in quantifying those elements. Several elements in the periodic table, starting from Na can be determined simultaneously in the ppm range using this versatile technique. The present work is aimed to elaborate the various steps involved in the PIXE analytical technique in detail.

"PIXE: Instrumentation", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.11, Issue 2, page no.f209-f214, February-2024, Available :http://www.jetir.org/papers/JETIR2402526.pdf

"PIXE: Instrumentation", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.11, Issue 2, page no. ppf209-f214, February-2024, Available at : http://www.jetir.org/papers/JETIR2402526.pdf