• Dr. M. Kiran Kumar
• K.Sai Sruthi
• G.Sumalatha

This paper aims to provide insights into novel methods for calculating and managing these parameters, potentially filling gaps and advancing the current understanding in the field of electrical engineering. Resistance ,experimental setup involves using ohmmeter or multimeter to measure direct resistance in circuits. Inductance is often measured using inductance meters or calculated through experiments involving magnetic fields and changing currents. Capacitance is determined using capacitance meters or through experiments assessing charge and voltage relationship. The calculated or measured values for resistance,inductance,capacitance reveal intricate relationships within the electrical circuits. Patterns and trends emerge, illustrating how changes in one parameter impact the others, providing insights into the dynamic behavior of electronic systems. The findings bear practical significance by guiding the design of electric circuits for enhanced efficiency and reliability, This paper advances the understanding of Electrical properties of electronic components, offering insights that can inform optimized circuit configurations

Resistance(R),Inductance(L),Capacitance(C,)capacitive reactance(Xc), inductive reactance(XL),frequency(f).

"Dynamic Behavior of Electronic Systems: R, L, and C", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.11, Issue 5, page no.m194-m199, May-2024, Available :http://www.jetir.org/papers/JETIR2405C28.pdf

"Dynamic Behavior of Electronic Systems: R, L, and C", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.11, Issue 5, page no. ppm194-m199, May-2024, Available at : http://www.jetir.org/papers/JETIR2405C28.pdf