UGC Approved Journal no 63975(19)
New UGC Peer-Reviewed Rules

ISSN: 2349-5162 | ESTD Year : 2014
Volume 13 | Issue 3 | March 2026

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Published in:

Volume 11 Issue 8
August-2024
eISSN: 2349-5162

UGC and ISSN approved 7.95 impact factor UGC Approved Journal no 63975

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Published Paper ID:
JETIR2408480


Registration ID:
547110

Page Number

e768-e777

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Title

Unifying Various Post-Silicon Testing Platforms to Address Throughput and Time-to-Market Challenges in Digital SoCs

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"Unifying Various Post-Silicon Testing Platforms to Address Throughput and Time-to-Market Challenges in Digital SoCs", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.11, Issue 8, page no.e768-e777, August-2024, Available :http://www.jetir.org/papers/JETIR2408480.pdf

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2349-5162 | Impact Factor 7.95 Calculate by Google Scholar

An International Scholarly Open Access Journal, Peer-Reviewed, Refereed Journal Impact Factor 7.95 Calculate by Google Scholar and Semantic Scholar | AI-Powered Research Tool, Multidisciplinary, Monthly, Multilanguage Journal Indexing in All Major Database & Metadata, Citation Generator

Cite This Article

"Unifying Various Post-Silicon Testing Platforms to Address Throughput and Time-to-Market Challenges in Digital SoCs", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.11, Issue 8, page no. ppe768-e777, August-2024, Available at : http://www.jetir.org/papers/JETIR2408480.pdf

Publication Details

Published Paper ID: JETIR2408480
Registration ID: 547110
Published In: Volume 11 | Issue 8 | Year August-2024
DOI (Digital Object Identifier):
Page No: e768-e777
Country: Pflugerville, TX, United States of America .
Area: Engineering
ISSN Number: 2349-5162
Publisher: IJ Publication
Published Paper URL :: https://www.jetir.org/view?paper=JETIR2408480
Published Paper PDF: https://www.jetir.org/papers/JETIR2408480

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