• Sandip Sudhakarrao Pande
• Yogendra B. Gandole

Automatic Test Pattern Generation (ATPG) for VLSI combinational circuits traditionally collapses the single stuck-at fault (SSF) universe to minimise test volume, at the cost of losing diagnosability. This paper presents DATPG, a diagnostic-driven ATPG framework that retains the full uncollapsed SSF universe and couples it with a pin-level fault-injection (pin_fix) array and a static spare-channel repair loop. A 4-bit ripple-carry adder is developed as the primary demonstrator (34 faults, 100% coverage, 0/561 indistinguishable pairs), and the identical flow is validated across four further circuits: a 4x4 multiplier, 4-bit comparator, 8x3 priority encoder and 4-bit barrel shifter, giving a five-circuit suite of 128 nets and 256 faults, of which 251 (98.0%) are detected while 5 are structurally redundant. Two pseudo-random generators, a 9-bit Galois LFSR (period 511, critical path 1.008 ns) and a 16-bit Lehmer MCG (period 16384, critical path 2.264 ns), each reach 100% fault coverage; their trade-off is quantified on a single footing. A Boolean-difference analysis proves every net-balanced fault is detected on exactly 50% of patterns, and the repair loop achieves 100% correction coverage. All results are reproduced from committed RTL, ModelSim-Altera 10.5b testbenches and Quartus Prime 18.1 fits on a Cyclone IV EP4CE6E22A7 device.

VLSI testing, automatic test pattern generation, fault injection, built-in self-test, fault diagnosability, linear feedback shift register, Lehmer generator.

"Diagnostic-Driven Automatic Test Pattern Generation with Pin-Fix Fault Injection and Spare-Channel Self-Healing", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.13, Issue 9, page no.d46-d51, September-2026, Available :http://www.jetir.org/papers/JETIR2609306.pdf

"Diagnostic-Driven Automatic Test Pattern Generation with Pin-Fix Fault Injection and Spare-Channel Self-Healing", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.13, Issue 9, page no. ppd46-d51, September-2026, Available at : http://www.jetir.org/papers/JETIR2609306.pdf