UGC Approved Journal no 63975

ISSN: 2349-5162 | ESTD Year : 2014
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Published in:

Volume 6 Issue 2
February-2019
eISSN: 2349-5162

UGC and ISSN approved 7.95 impact factor UGC Approved Journal no 63975

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Published Paper ID:
JETIREV06081


Registration ID:
311846

Page Number

508-512

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Title

Review on Atomic Force Microscopy

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Abstract

The AFM technique has grown into a valuable instrument for shortest measurement of topographical characteristics with the characterization of atomic resolution at nanoscale level. Atomic force microscope (AFM) These tools are typically functioned in three manners - contactless manner, touch manner, and tap manner. To control the various forces of the sample, the box is applying to push the box left from surface of substrate as well as to push box at or close its usual occurrence of reverberation. The touch manner instead gathers taster characteristics by nursing the contact forces when the probe of the lift is in touch with the object. The tap manner combines the quality of touch and non-contact mode through samples and oscillating the tip of the lift at or near the frequency of its normal reverberation, although enabling the knob to affect the goal taster for a short duration. The current work on AFM tools concentrated on numerous production and metrology approaches on a atomic level, thanks to its vast microscopic substrate competences. This paper discuss an overview of these latest breakthroughs in the AFM imagery approach with an importance on operating manners, probe dynamic design as well as handelling.

Key Words

AFM, Contact mode AFM, Microcantilevers, Non-contact mode AFM, Topography.

Cite This Article

"Review on Atomic Force Microscopy", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.6, Issue 2, page no.508-512, February-2019, Available :http://www.jetir.org/papers/JETIREV06081.pdf

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2349-5162 | Impact Factor 7.95 Calculate by Google Scholar

An International Scholarly Open Access Journal, Peer-Reviewed, Refereed Journal Impact Factor 7.95 Calculate by Google Scholar and Semantic Scholar | AI-Powered Research Tool, Multidisciplinary, Monthly, Multilanguage Journal Indexing in All Major Database & Metadata, Citation Generator

Cite This Article

"Review on Atomic Force Microscopy", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.6, Issue 2, page no. pp508-512, February-2019, Available at : http://www.jetir.org/papers/JETIREV06081.pdf

Publication Details

Published Paper ID: JETIREV06081
Registration ID: 311846
Published In: Volume 6 | Issue 2 | Year February-2019
DOI (Digital Object Identifier):
Page No: 508-512
Country: -, -, India .
Area: Engineering
ISSN Number: 2349-5162


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