UGC Approved Journal no 63975(19)
New UGC Peer-Reviewed Rules

ISSN: 2349-5162 | ESTD Year : 2014
Volume 12 | Issue 10 | October 2025

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Published in:

Volume 12 Issue 6
June-2025
eISSN: 2349-5162

UGC and ISSN approved 7.95 impact factor UGC Approved Journal no 63975

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Published Paper ID:
JETIRGW06079


Registration ID:
562466

Page Number

481-488

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Title

Digital Twin Integration for Smarter Semiconductor Manufacturing

Abstract

Modern semiconductor production requires advanced techniques because the manufacturing process needs enhanced speed control while reducing manufacturing defects. The research analyzes how Digital Twin (DT) technology serves as a groundbreaking management strategy to enhance semiconductor production optimization. A digital twin functions as a virtual representation of production processes to perform real-time evaluation which supports better efficiency and decision-making during operations. The designed framework uses advanced data analytics alongside machine learning and IoT technologies for predictive maintenance combined with quality assurance functionalities. The research proves that digital twin deployment leads to higher manufacturing output levels and decreased operational costs together with an environment that promotes steady manufacturing advancements. Manufacturers can use these discoveries to adopt digital twins because they help increase efficiency while ensuring competitive market position in today's evolving industrial environment. According to recent industry findings, companies implementing DT solutions report up to 30% reduction in downtime, 20% increase in productivity, and 25% reduction in operational costs.

Key Words

Semiconductor, Digital Twin, Machine Learning, IoT, Data Analytics.

Cite This Article

"Digital Twin Integration for Smarter Semiconductor Manufacturing", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.12, Issue 6, page no.481-488, June-2025, Available :http://www.jetir.org/papers/JETIRGW06079.pdf

ISSN


2349-5162 | Impact Factor 7.95 Calculate by Google Scholar

An International Scholarly Open Access Journal, Peer-Reviewed, Refereed Journal Impact Factor 7.95 Calculate by Google Scholar and Semantic Scholar | AI-Powered Research Tool, Multidisciplinary, Monthly, Multilanguage Journal Indexing in All Major Database & Metadata, Citation Generator

Cite This Article

"Digital Twin Integration for Smarter Semiconductor Manufacturing", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.12, Issue 6, page no. pp481-488, June-2025, Available at : http://www.jetir.org/papers/JETIRGW06079.pdf

Publication Details

Published Paper ID: JETIRGW06079
Registration ID: 562466
Published In: Volume 12 | Issue 6 | Year June-2025
DOI (Digital Object Identifier):
Page No: 481-488
Country: -, -, India .
Area: Engineering
ISSN Number: 2349-5162
Publisher: IJ Publication


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