• Shwetha. M.S
• Dr. Girija Kasal

Pair-Wise testing is a classic combinatorial test design technique, which is adoptable to any of the methodology from Waterfall to Agile methodology to save cost. No developer can say the code is bug free. Tester is one who never satisfied with the amount of testing is done. Tester always in application there is always a bug. For example, even in IPhone, Amazon and Flipkart there are many bugs. In testing, we could see four fundamental challenges. Complete testing is impossible. Testers misallocates resources because they fall for the company process myths. Test groups operates under multiple missions often conflicting rarely articulated. Test group often lack skilled programmers and a vision of appropriate project that would keep programming testers challenged. Why complete testing is impossible? Reasons are: Test every possible input to every variable, Test every possible combinations of input to every combination of variable, Test every possible sequence through the program and Test every hardware, software configuration including configuration of servers not under your control. Test every way in which the user might try to use the program. This leads to motivation to pairwise testing. It is determined that 98% of reported software defect is recalled medical devices could have been detected by testing all pairs of parameters settings. This paper focuses on Black Box technique, explained how All Pair testing covers maximum number of software defects with minimum Test cases, and thus saves time and cost of Software Development Life cycle. All Pair testing technique is applicable for different kind of testing such as Unit testing, Integration Testing, System Testing and Regression testing etc.,

SDLC, All-Pair testing,Combinatorial testing, Software testing, t-way testing, System Under Test.

"Black Box Testing Technique: How All Pair Testing Covers Maximum Number of Software Defects", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.6, Issue 4, page no.418-424, April-2019, Available :http://www.jetir.org/papers/JETIR1903I62.pdf

"Black Box Testing Technique: How All Pair Testing Covers Maximum Number of Software Defects", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.6, Issue 4, page no. pp418-424, April-2019, Available at : http://www.jetir.org/papers/JETIR1903I62.pdf