• R.Vinoth
• R.Sasireka
• L.Abisha
• M.Anupriya
• V.Harini

Soft errors induced by radiation are a major reliability concern for memories. For past years a memory reliability is a concern for soft errors. With changes in device feature includes size decreasing and memory density increasing, an event upset in memory may cause data errors that may generate adjacent bit upsets in a word. Error Correction Codes (ECC) are commonly used to protect the memory contents from soft error and to avoid data errors in a memory. Advanced technology scaling reduces the distance between the memory cells, which makes soft errors in more memory cells once a radiation particle hit. Therefore, the construction of ECCs with advanced error correction and low redundancy which causes an important problem, especially for adjacent or burst errors. The main objective of this project is to prevent the memory against soft error by Burst Error Correction and Error Detection techniques with low redundancy and design complexity. To attain this objective, a technique called extend 4-bit adjacent error correction with 7-bit adjacent error correction (7-AEC) is presented by using the proposed search algorithm.It provides the protection of SRAM from radiation effects and mitigating the MBUs that affect up to six adjacent bits.

Burst error correction codes (ECC), Multiple bit upset (MBU), Memory, Soft errors, Quadruple adjacent error correction (QAEC).

"Extending Quadruple Adjacent Error Detection and Correction to Seven Bit Adjacent Error Correction to Protect Memory from Soft Errors", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.6, Issue 4, page no.397-408, April-2019, Available :http://www.jetir.org/papers/JETIR1904M60.pdf

"Extending Quadruple Adjacent Error Detection and Correction to Seven Bit Adjacent Error Correction to Protect Memory from Soft Errors", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.6, Issue 4, page no. pp397-408, April-2019, Available at : http://www.jetir.org/papers/JETIR1904M60.pdf