• Saish Abdagire
• Ganesh Patil
• Madhura Rakhe
• Sonali Kashid

In the past, the designing and the testing of the IC had a huge gap, which was then bridged by the test engineering by developing and adopting a unified approach called “Design for Testability”. The most important step for Testing any fault in an IC is to know where the problem exactly lies in the ICs, so the process of Fault localization is used for this purpose.However with the evolution of different IC testing methods there was an increase in testing and maintenance cost,Thus in such a situation where other methods have turned out to be less effective,BIST has provided improved efficiency with its shorter test application times and reduced cost

fault model,test pattern generation

"Comparative Analysis of Structured Design for Testability techniques", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.10, Issue 7, page no.c454-c456, July-2023, Available :http://www.jetir.org/papers/JETIR2307254.pdf

"Comparative Analysis of Structured Design for Testability techniques", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.10, Issue 7, page no. ppc454-c456, July-2023, Available at : http://www.jetir.org/papers/JETIR2307254.pdf