• Gajarao Roop Kumar
• Hanumanthu Sruthi
• Kathi Cherishma
• Katari Sunil Kumar
• Chebrolu Praveen Kumar

A radiation-induced single-event upset (SEU) is a major disruption to electronics operating in satellites. If not rectified, a single-bit-error can become uncorrectable. There are several methods like Forward Error Correction Codes, Error Correction Codes, hamming codes, and many more from these methods, individual HSIAO, CRC, Hamming, BCH are used for error correction & detection. This project, presents two interleaved Double-Adjacent-Error Corrections (DAECs) for Error Detection and Correction (EDAC), using the Hsiao Code and Cyclic Redundancy Code (CRC). In this design single-bit-error, double-adjacent-bit-errors can be corrected and double bit-errors up to four-adjacent-bit-errors can be detected and corrected. The Hsiao Code EDAC has the best performance for speed, hardware requirement, and three- and four-bit-error detection. Its higher three- and four-bit error detection rates reduce the probability of an erroneous EDAC correction. The Hsiao code EDAC encoder design requires less bit – weight than the CRC EDAC, in contrast, has a higher error detection rate for both three- and four-bit errors. We used Verilog HDL and Xilinx Vivado to create and simulate designs.

Index Terms – Hsiao Code, CRC, Hamming Code, BCH, EDAC

"DESIGN OF TWO INTERLEAVED ERROR DETECTION AND CORRECTION USING HSIAO CODE AND CRC", International Journal of Emerging Technologies and Innovative Research (www.jetir.org), ISSN:2349-5162, Vol.11, Issue 5, page no.c397-c402, May-2024, Available :http://www.jetir.org/papers/JETIR2405247.pdf

"DESIGN OF TWO INTERLEAVED ERROR DETECTION AND CORRECTION USING HSIAO CODE AND CRC", International Journal of Emerging Technologies and Innovative Research (www.jetir.org | UGC and issn Approved), ISSN:2349-5162, Vol.11, Issue 5, page no. ppc397-c402, May-2024, Available at : http://www.jetir.org/papers/JETIR2405247.pdf